We are currently performing test optical properties calculations for elemental systems such as Fe, Ti, and Al using VASP, WIEN2k, and RSPt to check for consistency. While analyzing the imaginary part of the dielectric function, we observed inconsistency in the results obtained from VASP, RSPt and WIEN2k (See enclosed figure).
Specifically, in the energy range below 3 eV, the absorptive part of the dielectric tensor calculated using RSPt shows noticeably lower values, whereas WIEN2k and VASP yield slightly higher values that are in close agreement with each other. However, beyond 3 eV, all three methods produce results that are in good agreement. But, in the case of semiconductors (Si) all three codes are agreeing well.
We have taken care to ensure that the k-point sampling, broadening parameters, and convergence criteria are as consistent as possible across all three codes. Despite this, the low-energy deviation persists between these codes.
We would greatly appreciate any insights you might have regarding this discrepancy. Could this be related to the basis set involved or the way optical matrix elements are handled between these codes?
For Optical calculations, we are unable to use the tetrahedron method (ISMEAR = -4/-5) for metals, or is there any way to use the tetrahedron method for optics?
We are attaching the input files (GGA) and the output plots for the absorptive part of the dielectric tensor for your reference.
Thanking you in advance for your time and consideration.
Best Regards
Abhishek K G
Jayendran S
SCANMAT Centre.